Fluid immersion AFM for use with optomechanical probes.
| Agency: | |
|---|---|
| Level of Government: | Federal |
| Category: |
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| Opps ID: | NBD00159452505366377 |
| Posted Date: | Feb 15, 2024 |
| Due Date: | Feb 29, 2024 |
| Source: | https://sam.gov/opp/e2345faf4e... |
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- Contract Opportunity Type: Sources Sought (Original)
- All Dates/Times are: (UTC-05:00) EASTERN STANDARD TIME, NEW YORK, USA
- Original Published Date: Feb 15, 2024 02:52 pm EST
- Original Response Date: Feb 29, 2024 11:00 am EST
- Inactive Policy: 15 days after response date
- Original Inactive Date: Mar 15, 2024
-
Initiative:
- None
- Original Set Aside:
- Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
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NAICS Code:
- 334516 - Analytical Laboratory Instrument Manufacturing
-
Place of Performance:
Gaithersburg , MDUSA
The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a customized fluid immersion atomic force microscope (AFM) to develop advanced in-situ measurement methods of physical-chemical processes at the solid-liquid interfaces with relevance to semiconductor manufacturing. See attached Sources Sought Notification.
- ACQUISITION MANAGEMENT DIVISION 100 BUREAU DR.
- GAITHERSBURG , MD 20899
- USA
- Brandon Butler
- brandon.butler@nist.gov
- Tracy Retterer
- Tracy.retterer@nist.gov
- Feb 15, 2024 02:52 pm ESTSources Sought (Original)
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